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> HOME > References and Applications >Surface tension measurement of molten silicon by the oscillating drop method using electromagnetic levitation
Surface tension measurement of molten silicon by the oscillating drop method using electromagnetic levitation

 

  • a Deutsche Forschungsanstalt für Luft- und Raumfahrt, D-51147 Köln, Germany
  • b Fundamental Research Laboratories, NEC Corporation, Tsukuba 305, Japan

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